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FEI's DualBeam (FIB/SEM) systems are the preferred solution for 3D microscopy and analysis serving material characterization, industrial failure analysis and process control applications.
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insert into prodandcate set products_id='995', products_name='Helios NanoLab DualBeam', products_description='


The Helios NanoLab™  DualBeam™  has always combined FEI\'s best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology\'s leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research. 


With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements. 

', products_head_desc_tag='', products_image='Helios.jpg', manufacturers_id='0', products_price='0.0000', products_tax_class_id='0', final_price='0.0000', specials_new_products_price='', sort_order=''