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Products » Electron Microscopy » Electron Optics » DualBeam

DualBeam

FEI's DualBeam (FIB/SEM) systems are the preferred solution for 3D microscopy and analysis serving material characterization, industrial failure analysis and process control applications.

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The Helios NanoLab™ DualBeam™ has always combined FEI\'s best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. For scientists working at nanotechnology\'s leading edge, Helios NanoLab lets them push boundaries and create new possibilities for materials research.

With highly valued sub-nm SEM imaging, the capability to produce ultra-thin samples for S/TEM, and the most precise prototyping capabilities, scientists choose the Helios NanoLab as their partner for innovating new materials and nanoscale devices that will influence future advancements.

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DualBeam